Automatic Extraction of Material Defect Size by Infrared Image Sequence
- Lihua Yuan*
- , Xiao Zhu
- , Quanbin Sun
- , Haibo Liu
- , Peter Yuen
- , Yonghuai Liu
*Corresponding author for this work
- Nanchang Hangkong University
- Birmingham City University
- Harbin Engineering University
- Cranfield University
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